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Dilatometer / TMAThermal Expansion Measurements
CHIP-DSC/High Temperature DSCMelting Point, Enthalpy, Specific Heat, Glass transition
TGA / STA (TGA-DSC)Thermal Mass Loss and Caloric Measurement
LFA / THB / HFM and moreThermal Diffusivity / Thermal Conductivity / Heat Capacity
LSRElectric Resistivity/ Seebeck coefficient / Harman-Method / ZT of Modules
TIM TesterCharacterization of Thermal Interface Materials and Phase Change Materials under variable load and temperatures
TEG TesterCharacterize Thermoelectric Generators and Peltier-Elements
Thin Film Analysis (TFA)Characterize thin films from 80 nanometers to 20 micrometers
Hall Effect Analysis (HCS)Characterization of Semiconductor Devices
Gravimetric Sorption Analyzer (GSA)Gravimetric Sorption analysis with a mechanical microbalance or magnetic levitation balance
Differential Thermal Analysis (DTA)Material analysis for endothermic or exothermic reactions
Accessories and Options
Gas AnalysisAll Analyzers can be connected to a quadrupole mass spectrometer (QMS) or a FTIR spectrometer (Fourier-transform infrared spectroscopy).
Gas Dosing SystemUltra-high vacuum, normal pressure or high pressure, Linseis offers suitable gas control systems
